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US Patent Issued to The Regents of the University of California on Sept. 8 for "System and method for deforming and analyzing particles" (California Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,057, issued on Sept. 8, was assigned to The Regents of the University of California (Oakland, Calif.). "System and method for deforming and... Read More


US Patent Issued to Sony Group on Sept. 8 for "Particle sorting apparatus and particle sorting method" (Japanese Inventor)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,058, issued on Sept. 8, was assigned to Sony Group Corp. (Tokyo). "Particle sorting apparatus and particle sorting method" was invented by ... Read More


US Patent Issued to ASML NETHERLANDS on Sept. 8 for "Apparatus and method for cleaning an inspection system" (Dutch Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,059, issued on Sept. 8, was assigned to ASML NETHERLANDS B.V. (Veldhoven, Netherlands). "Apparatus and method for cleaning an inspection sy... Read More


US Patent Issued to Duke University on Sept. 8 for "Systems and methods for photoacoustic microscopy" (North Carolina Inventor)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,060, issued on Sept. 8, was assigned to Duke University (Durham, N.C.). "Systems and methods for photoacoustic microscopy" was invented by ... Read More


US Patent Issued to Sensirion Connected Solutions on Sept. 8 for "Vibration damped sensor device" (Swiss Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,061, issued on Sept. 8, was assigned to Sensirion Connected Solutions AG (Stafa, Switzerland). "Vibration damped sensor device" was invente... Read More


US Patent Issued to TSINGHUA SHENZHEN INTERNATIONAL GRADUATE SCHOOL on Sept. 8 for "Polarizer and analyzer configuration optimization method and polarizing and analyzing system" (Chinese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,062, issued on Sept. 8, was assigned to TSINGHUA SHENZHEN INTERNATIONAL GRADUATE SCHOOL (Shenzhen, China). "Polarizer and analyzer configur... Read More


US Patent Issued to H2Ok Innovations on Sept. 8 for "Methods and systems for monitoring fluids" (California, Florida, Massachusetts Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,063, issued on Sept. 8, was assigned to H2Ok Innovations Inc. (Somerville, Mass.). "Methods and systems for monitoring fluids" was invented... Read More


US Patent Issued to Infineon Technologies on Sept. 8 for "Package for an optical radiation device" (British, German Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,064, issued on Sept. 8, was assigned to Infineon Technologies AG (Neubiberg, Germany). "Package for an optical radiation device" was invent... Read More


US Patent Issued to Hitachi High-Tech on Sept. 8 for "Defect inspection device" (Japanese Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,065, issued on Sept. 8, was assigned to Hitachi High-Tech Corp. (Tokyo). "Defect inspection device" was invented by Takeru Utsugi (Tokyo), ... Read More


US Patent Issued to LEICA MICROSYSTEMS NC on Sept. 8 for "Method for three-dimensional (3D) image calibration for a spectral domain optical coherence tomography (OCT) system" (North Carolina Inventors)

ALEXANDRIA, Va., Sept. 8 -- United States Patent no. 12,730,066, issued on Sept. 8, was assigned to LEICA MICROSYSTEMS NC INC. (Durham, N.C.). "Method for three-dimensional (3D) image calibration for... Read More